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Laser Bar Test System

Laser Bar Test System

The Laser Bar Test System is a fully automated testing system dedicated to evaluating the optoelectronic performance of BAR-type laser chips.
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The equipment integrates high-precision visual positioning, multi-axis motion platform, temperature-controlled stage, and integrating sphere/collimating lens light-receiving module, suitable for LIV comprehensive testing and spectral analysis testing under both room temperature and high temperature (adjustable from 25 to 85°C) environments. It can comprehensively quantify key parameters of the chip such as threshold current, slope efficiency, optical output power, peak power, forward voltage, and wavelength.

Wide range of applications

  • Supports DFB or EML lasers

High-precision opto-electronic testing

  • The LIV test adopts an integrating sphere light collection scheme, The power measurement covers a range of 5nW to 7W, and the wavelength measurement range is from 800 to 1650nm

Precision electrical drive

  • Equipped with a Keithley 2602B source meter, it caters to both small signals and high-power drive requirements

Precision temperature control and positioning

  • The temperature control accuracy and stability of the TEC (Thermo-Electric Cooler) system both reach ±0.1℃, and the motorized stage repeatability is ±0.5μm

Intelligent automatic process

  • It supports automatic feeding, automatic coupling, and automatic probing, with real-time display of test results. It also features probe mark pressure monitoring, Chip ID recognition, and the ability for secondary development of external program interfaces